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Development of rigid-flex and multilayer flex for electronic packaging

机译:开发用于电子包装的刚挠和多层挠性

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Recent development work on flex joining using different pre-pregs is highlighted, particularly with respect to their integration in laminate chip carrier substrates, and the reliability of the joints formed between the rigid and flex surfaces. A variety of rigid-flex structures were fabricated, with 1 to 3 flex layers laminated into printed wiring board substrates. Photographs and optical microscopy were used to investigate the joining, bending, and failure mechanism. Flexibility decreased with increasing number of metal layers. The flexibility of the various flexes was characterized by roll diameter and bend angle. Flex substrates exhibited roll diameter with polyimide dielectric as low as 180 mils for 2 metal layers, and as high as 1300 mils for 6 metal layers. Similarly, bending for 12 metal layers flex with thin and thick dielectric were <1 inch and >1 inch, respectively. Reliability of the rigid-flex was ascertained by IR-reflow, thermal cycling, pressure cooker test (PCT), and solder shock. There was no delamination for Resin coated copper (rigid)-polyimide (flex) samples after IR-reflow, PCT, and solder shock. The paper also describes a novel approach for the fabrication of flexible electronics on PDMS substrates. It was found that with increasing thickness, the flexibility of the polydimethylsiloxane (PDMS) based substrate decreased less due to stretching property of PDMS. The present process evaluates the fabrication of PDMS substrates using different circuit lines and spaces.
机译:着重强调了有关使用不同预浸料的挠曲接合的最新开发工作,特别是关于它们在层压芯片载体基板中的集成以及在刚性和挠性表面之间形成的接头的可靠性方面。制造了各种刚柔结构,其中有1至3个挠性层层压在印刷线路板基板上。使用照片和光学显微镜研究连接,弯曲和破坏机理。柔性随着金属层数量的增加而降低。各种弯曲度的柔韧性通过辊直径和弯曲角度来表征。挠性基材的卷径和聚酰亚胺电介质的2个金属层低至180密耳,而6个金属层高至1300密耳。类似地,具有薄和厚电介质的12个金属层弯曲的弯曲分别小于1英寸和大于1英寸。刚性-挠性的可靠性通过IR回流,热循环,压力锅测试(PCT)和焊料冲击来确定。红外回流,PCT和焊锡冲击后,树脂涂层的铜(刚性)-聚酰亚胺(柔性)样品没有分层。本文还介绍了一种在PDMS基板上制造柔性电子产品的新颖方法。已经发现,随着厚度的增加,基于聚二甲基硅氧烷(PDMS)的基材的柔韧性由于PDMS的拉伸性能而降低得较少。本方法评估使用不同电路线和空间的PDMS衬底的制造。

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