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SNR Improvement for Hyperspectral application using frame and pixel binning

机译:使用帧和像素合并的高光谱应用的SNR改善

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Hyperspectral imaging spectrometer systems are increasingly being used in the field of remote sensing for variety of civilian and military applications. The ability of such instruments in discriminating finer spectral features along with improved spatial and radiometric performance have made such instruments a powerful tool in the field of remote sensing. Design and development of spaceborne hyper spectral imaging spectrometers poses lot of technological challenges in terms of optics, dispersion element, detectors, electronics and mechanical systems. The main factors that define the type of detectors are the spectral region, SNR, dynamic range, pixel size, number of pixels, frame rate, operating temperature etc. Detectors with higher quantum efficiency and higher well depth are the preferred choice for such applications. CCD based Si detectors serves the requirement of high well depth for VNIR band spectrometers but suffers from smear. Smear can be controlled by using CMOS detectors. Si CMOS detectors with large format arrays are available. These detectors generally have smaller pitch and low well depth. Binning technique can be used with available CMOS detectors to meet the large swath, higher resolution and high SNR requirements. Availability of larger dwell time of satellite can be used to bin multiple frames to increase the signal collection even with lesser well depth detectors and ultimately increase the SNR. Lab measurements reveal that SNR improvement by frame binning is more in comparison to pixel binning. Effect of pixel binning as compared to the frame binning will be discussed and degradation of SNR as compared to theoretical value for pixel binning will be analyzed.
机译:高光谱成像光谱仪系统越来越多地用于各种民用和军事应用的遥感领域。这种仪器区分更精细的光谱特征的能力以及改进的空间和辐射测量性能,使此类仪器成为遥感领域的强大工具。星载高光谱成像光谱仪的设计和开发在光学,色散元件,检测器,电子和机械系统方面提出了许多技术挑战。定义探测器类型的主要因素是光谱区域,SNR,动态范围,像素大小,像素数量,帧速率,工作温度等。具有较高量子效率和较高阱深度的探测器是此类应用的首选。基于CCD的Si检测器可满足VNIR波段光谱仪对高井深的要求,但会产生拖影。涂片可通过CMOS检测器进行控制。提供具有大格式阵列的Si CMOS检测器。这些检测器通常具有较小的螺距和较低的阱深度。 Binning技术可与可用的CMOS检测器一起使用,以满足大范围,更高的分辨率和较高的SNR要求。可以使用更长的卫星驻留时间来合并多个帧,以增加信号收集,即使使用较少的井深检测器也可以最终提高SNR。实验室测量表明,与像素合并相比,帧合并可改善SNR。将讨论与帧合并相比像素合并的效果,并且将分析与像素合并理论值相比的SNR下降。

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