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Systematic parameter calibration in the wavefront testing with reverse Hartmann test

机译:反向Hartmann测试在波前测试中的系统参数校准

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摘要

The deflectometry based on reverse-Hartmann-test configuration provides a feasible way for wavefront testing. Objects with complex surfaces place a high requirement on the wavefront testing accuracy, in which the systematic parameter is the key issue. In this paper, the effect of systematic parameters of the testing system such as the geometrical error and the approximation of systematic geometrical parameters are discussed in detail and a calibration method is proposed. Numerical simulation is carried out to demonstrate the feasibility of the proposed calibration method, for the transmitted wavefront with RMS 3.1220 urn, the testing optimization result of residual error with RMS value better than 20 nm is achieved.
机译:基于反向哈特曼测试配置的偏转仪为波前测试提供了一种可行的方法。具有复杂表面的物体对波前测试精度有很高的要求,其中系统参数是关键问题。本文详细讨论了测试系统的系统参数如几何误差和系统几何参数逼近的影响,并提出了一种校准方法。通过数值模拟验证了所提出的标定方法的可行性,对于RMS值为3.1220 urn的透射波前,可以获得RMS值大于20 nm的残留误差的测试优化结果。

著录项

  • 来源
    《Optical design and testing VIII》|2018年|108150Q.1-108150Q.9|共9页
  • 会议地点 Beijing(CN)
  • 作者单位

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China;

    Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China;

    Guangxi Key Laboratory of Optoelectronic Information Processing (Guilin University of Electronic Technology), Guilin 541004, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    wavefront testing; reverse Hartmann test; ray tracing; systematic parameter calibration;

    机译:波前测试;反向哈特曼测试;射线追踪系统参数校准;
  • 入库时间 2022-08-26 14:33:06

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