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METHOD OF TESTING LENSE USING SHACK-HARTMANN WAVEFRONT SENSOR

机译:使用Shark-Hartmann波前传感器测试镜头的方法

摘要

A method for testing a lens using a Shack-Hartmann wavefront sensor is provided to measure the difference between a reference property and a measured property of the lens by precisely checking spots formed by micro-lenses. A wavefront to be transmitted through a lens to be inspected is calculated, based on a design data of the lens(S200). First spots are set by calculating the position of plural images which are detected by an image sensor when the calculated wavefront passes through a plurality of micro lenses(S300). The first spots correspond to lens sections of the micro lens. Second spots which are positions of images that are detected by the image sensor when the wavefront passes through the micro lenses after passing through the lens to be inspected, are measured(S500). The second spots correspond to the nearest neighboring first spots, respectively and it is determined that the second spots are formed by the micro-lens section corresponding to the first spots(S600). The displacement between the first and second spots is calculated(S800).
机译:提供一种使用Shack-Hartmann波前传感器测试透镜的方法,以通过精确地检查由微透镜形成的斑点来测量透镜的参考特性和测量特性之间的差异。基于透镜的设计数据来计算要透射通过检查透镜的波前(S200)。通过计算当计算的波前穿过多个微透镜时由图像传感器检测到的多个图像的位置来设置第一点(S300)。第一点对应于微透镜的透镜部分。测量第二点,该第二点是在通过被检查的透镜之后波前通过微透镜时图像传感器检测到的图像的位置(S500)。第二点分别对应于最邻近的第一点,并且确定第二点由与第一点相对应的微透镜部分形成(S600)。计算第一点和第二点之间的位移(S800)。

著录项

  • 公开/公告号KR20070115193A

    专利类型

  • 公开/公告日2007-12-05

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRO-MECHANICS CO. LTD.;

    申请/专利号KR20060049236

  • 发明设计人 CHAE KYU MIN;

    申请日2006-06-01

  • 分类号G01M11/02;G01M11/00;

  • 国家 KR

  • 入库时间 2022-08-21 19:54:47

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