首页> 外文会议>CSPE-JSME-ASME International Conference on Power Engineering Vol.2 Oct 8-11, 2001, Xi'an, China >DEVELOPMENT OF A HIGH SPEED DATA ACQUISITION SYSTEM FOR ELECTRICAL CAPACITANCE TOMOGRAPHY
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DEVELOPMENT OF A HIGH SPEED DATA ACQUISITION SYSTEM FOR ELECTRICAL CAPACITANCE TOMOGRAPHY

机译:电容层析成像的高速数据采集系统的开发

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摘要

A new capacitance measuring circuit based on charge amplification principle for electrical capacitance tomography has been developed. The measured capacitance is only charged and discharged once and no noise is created by the measurement principle. Test results show the data acquisition time for 66 capacitance (for reconstructing one image) is 4.2ms and the time for transmitting the data is 2ms.
机译:开发了一种基于电荷放大原理的电容层析成像新的电容测量电路。被测电容仅充电和放电一次,并且测量原理不会产生噪声。测试结果表明,用于66个电容的数据采集时间(用于重建一幅图像)为4.2毫秒,传输数据的时间为2毫秒。

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