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Specular and diffuse x-ray scattering from tungsten/carbon multilayers having a high reflectivity at 10 keV

机译:在10 keV时具有高反射率的钨/碳多层膜的镜面和漫射x射线散射

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Abstract: X-ray scattering measurements at 10 keV from multilayers having a period of 24.8 Angstrom and consisting of 100 W/C bilayers are reported. Specular scans revealed first order reflectivities in the range 73.5% to 78.0% with bandpasses in the range of 1.5% to 1.7%. Total roughness (or interface grading) values deduced from fitting were in the range 2.5 to 3.0 angstrom for the last-to-grow surface of the W layers. Diffuse scattering measurements were made in a novel geometry that permitted investigation of in-plane momentum transfers up to 0.2 Angstrom$+$MIN@1$/. This is roughly an order of magnitude larger than is possible in conventional rocking scans. A power law dependence of the diffuse scattering after integration over a 'Brillioun zone' is found. The exponent of this power law, 1.75, when interpreted using a logarithmic correlation function leads to a value of 1.0 angstrom for the correlated roughness. !17
机译:摘要:报告了在10 keV下对周期为24.8埃,由100 W / C双层构成的多层膜进行的X射线散射测量。镜面扫描显示一级反射率在73.5%至78.0%的范围内,带通在1.5%至1.7%的范围内。对于W层的最后生长表面,通过拟合得出的总粗糙度(或界面渐变)值在2.5至3.0埃的范围内。扩散散射测量是在一种新颖的几何形状中进行的,该几何形状允许研究面内动量传递最大0.2埃++ MIN @ 1 $ /。这比常规摇摆扫描大约大一个数量级。发现在“布里渊区”上积分之后扩散散射的幂定律依赖性。当使用对数相关函数来解释该幂律的指数1.75时,相关粗糙度的值为1.0埃。 !17

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