首页> 外文会议>Conference on UV, Optical, and IR Space Telescopes and Instruments 29-31 March 2000 Munich, Germany >32 pixel FIRGA demonstrator-testing of a gallium arsenide photoconductor array for far infrared astronomy
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32 pixel FIRGA demonstrator-testing of a gallium arsenide photoconductor array for far infrared astronomy

机译:砷化镓光电导体阵列的32像素FIRGA演示器测试,用于远红外天文学

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A gallium arsenide photoconductive detector, which is sensitive in the far-infrared wavelength range from approximately 60 mu m to 300 mu m, offers the advantage of extending considerably the long wavelength cut-off of presently available photodetectors. FIRGA is an ESA spnsored GaAs detector development program which is approaching completion. The FIRGA study is intended to prepare the technology for large two-dimensional GaAs detector arrays for far-infrared astronomy. The primary goal of the development is the preparation of a monolighic 32 element demonstrator array module with associated crysogenic read-out electronics. Continuous progress in material research has led to the production of pure and doped n-type GaAs layers using liquid phase epitaxy (LPE). We prepared sample detectors from those materials and investigated their electrical and infrared characteristics. Finally, a multi-layer structured detector device was manufactured. The 4x8 element array configuration is defined by sawing a slit pattern into the layers with pixel size 1mm x 1mm. The device is back illuminated. The 32 pixels are connected to two cryogenic read-out electroics chips mounted close-by. Results of the initial detector performance tests are reported. We determined dark current, responsivity and response transients. Ongoing development activities will concentrate on material research, i.e. the production of n-GaAs layers of ultra-high purity and those with improved FIR characteristics using new centrifugal techniques for material growth.
机译:砷化镓光电导检测器在大约60μm至300μm的远红外波长范围内敏感,其优点是大大延长了目前可用的光电检测器的长波长截止范围。 FIRGA是ESA赞助的GaAs探测器开发计划,即将完成。 FIRGA研究旨在为远红外天文学的大型二维GaAs探测器阵列准备技术。开发的主要目的是制备具有相关的低温读出电子器件的单单元32元素演示器阵列模块。材料研究的不断进步已导致使用液相外延(LPE)生产纯掺杂n型GaAs层。我们用这些材料制备了样品检测器,并研究了它们的电学和红外特性。最终,制造了多层结构的检测器装置。通过将狭缝图案锯切成像素大小为1mm x 1mm的层来定义4x8元素阵列配置。设备背光。 32个像素连接到两个附近安装的低温读出电子芯片。报告了初始检测器性能测试的结果。我们确定了暗电流,响应度和响应瞬态。正在进行的开发活动将集中于材料研究,即使用新的离心技术进行材料生长来生产超高纯度的n-GaAs层和具有改善的FIR特性的层。

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