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Thick-Film Gold and Platinum Conducing Paths for High Temperature Electronics

机译:高温电子的厚膜金和铂导电路径

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摘要

A new thick film gold conductive composition for high temperature electronics was elaborated and tested. This paste was designed for metallization of the alumina substrates (Al_2O_3) for electrical interconnection system, e.g. for a silicon carbide Schotky diode. Also platinum pastes for conductive paths resistant to high temperatures (over 600℃) were elaborated by the authors. Several gold and platinum powders and glasses, as well as bonding oxides were examined to design a suitable composition. The influence of the paste composition and firing temperature on the layer properties was shown. The obtained layers were aged a 1000 hours at elevated temperatures (350℃). Sheet resistance of platinum and gold paths was measured. Mechanical strength and electrical resistance of wire bonds to the gold layers after aging were also examined. The electrical measurements were performed at room temperature and elevated temperature (150℃, 250℃, 350℃), using precise four-wire method. The microstructure of layers was also shown.
机译:研制并测试了一种用于高温电子学的新型厚膜金导电组合物。设计该糊剂用于金属互连的氧化铝基板(Al_2O_3),例如电互连系统。用于碳化硅肖特基二极管。作者还精心制作了用于高温(超过600℃)的导电路径的铂糊。检查了几种金和铂粉和玻璃以及粘结氧化物,以设计合适的组合物。显示了糊的组成和烧成温度对层性能的影响。将获得的层在高温(350℃)下老化1000小时。测量了铂和金路径的薄层电阻。还检查了老化后导线与金层的焊线的机械强度和电阻。使用精确的四线方法在室温和高温(150℃,250℃,350℃)下进行电测量。还显示了层的微观结构。

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