Multi-channel Boundary Scan Controller

摘要

The paper presents, a specially designed chip, which ensures the carrying out of tests compliant with IEEE 1149.1-1990 Std. The above mentioned tests are very useful when checking for any errors and defects in electronics devices. The currently available solutions are not suitable for the requirements, which are quite specific and are the result of past experience. Therefore, a dedicated Field Programmable Gate Array (FPGA) core was created in VLSI Hardware Description Language (VHDL) implementing the desired functionality. The achieved result is a BS controller supporting many BS chains, working in parallel and using pipelining to boost performance.