首页> 外文会议>Conference on Photonic Devices and Algorithms for Computing II, Aug 2-3, 2000, San Diego, USA >Optoelectronic complex inner product for evaluating quality of image segmentation
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Optoelectronic complex inner product for evaluating quality of image segmentation

机译:光电复合内部产品,用于评估图像分割质量

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In automatic target recognition and machine vision applications, segmentation of the images is a key step. Poor segmentation reduces the recognition performance. For some imaging systems such as MRI and Synthetic Aperture Radar (SAR) it is difficult even for humans to agree on the location of the edge which allows for segmentation. A real-time dynamic approach to determine the quality of segmentation can enable vision systems to refocus or apply appropriate algorithms to ensure high quality segmentation for recognition. A recent approach to evaluate the quality of image segmentation uses percent-pixels-different (PPD). For some cases, PPD provides a reasonable quality evaluation, but it has a weakness in providing a measure for how well the shape of the segmentation matches the true shape. This paper introduces the complex inner product approach for providing a goodness measure for evaluating the segmentation quality based on shape. The complex inner product approach is demonstrated on SAR target chips obtained from the Moving and Stationary Target Acquisition and Recognition (MSTAR) program sponsored by the Defense Advanced Research Projects Agency (DARPA) and the Air Force Research Laboratory (AFRL). The results are compared to the PPD approach. A design for an optoelectronic implementation of the complex inner product for dynamic segmentation evaluation is introduced.
机译:在自动目标识别和机器视觉应用中,图像分割是关键步骤。分割不佳会降低识别性能。对于某些成像系统,例如MRI和合成孔径雷达(SAR),即使是人类,也很难在允许分割的边缘位置上达成共识。确定分割质量的实时动态方法可以使视觉系统重新聚焦或应用适当的算法,以确保高质量的分割以进行识别。一种评估图像分割质量的最新方法是使用像素差百分比(PPD)。在某些情况下,PPD提供了合理的质量评估,但是在提供度量分割形状与真实形状的匹配程度方面存在缺陷。本文介绍了复杂的内部产品方法,该方法可提供良好的度量来评估基于形状的细分质量。在由国防高级研究计划局(DARPA)和空军研究实验室(AFRL)赞助的“移动和固定目标获取与识别(MSTAR)”计划获得的SAR目标芯片上,演示了复杂的内积方法。将结果与PPD方法进行比较。介绍了用于动态细分评估的复杂内部产品的光电实现设计。

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