首页> 外文会议>Conference on Photon Processing in Microelectronics and Photonics; 20080121-24; San Jose,CA(US) >Debris Generation from CO_2 and Nd:YAG Laser-Produced Tin Plasmas for EUV Light Source
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Debris Generation from CO_2 and Nd:YAG Laser-Produced Tin Plasmas for EUV Light Source

机译:CO_2和Nd:YAG激光产生的用于EUV光源的锡等离子体产生的碎屑

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摘要

The results of a comparative investigation on the emission characteristics of debris from CO_2 laser-produced tin plasma and Nd: YAG laser-produced tin plasma for an extreme ultraviolet lithography (EUV) light source. The tin ions and droplets emitted from tin plasma produced by a CO_2 laser or an Nd: YAG laser were detected with Faraday cups and quartz crystal micro-balance (QCM) detectors, respectively. The large size of droplets was also observed by silicon substrates as witness plates. A higher ion kinetic energy and lower debris emission in the case of CO_2 laser in compared with Nd: YAG laser for the same laser energy of ~50 mJ. In addition, the dynamics of the neutral atoms and the irradiated target from an Nd:YAG laser-produced tin plasma with a mass-limited micro-droplet target were investigated by imaging techniques.
机译:比较研究了用于极端紫外光刻(EUV)光源的CO_2激光产生的锡等离子体和Nd:YAG激光产生的锡等离子体中的碎屑发射特性。使用法拉第杯和石英微天平(QCM)检测器分别检测由CO_2激光或Nd:YAG激光产生的锡等离子体产生的锡离子和液滴。还通过硅基板作为见证板观察到大滴的液滴。在相同的〜50 mJ激光能量下,与Nd:YAG激光相比,CO_2激光具有更高的离子动能和更低的碎屑发射。此外,通过成像技术研究了Nd:YAG激光产生的锡等离子体与质量受限的微滴靶的中性原子和被辐照靶的动力学。

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