Analysis of degradation in CuInSe_2 photovoltaic modules

摘要

In this study, two Ⅰ-Ⅲ-Ⅵ ternary chalcopyrite (CuInSe_2) photovoltaic modules were subjected to an initial indoor assessment procedure, deployed outdoors and periodically taken down for indoor assessment. Results obtained revealed that both modules degraded over the test period and that the technology is extremely susceptible to hot-spot formation caused by shading. Both modules were also found to have cells with low shunt resistances. After initial exposure, the shunt resistance of both modules decreased even further, suggesting an increase in the number of shunt paths. This paper carefully evaluates and analyses the observed degradation.