首页> 外文会议>Conference on Instruments for Optics and Optoelectronic Inspection and Control 8-10 November 2000 Beijing, China >The numericla simulation of photoelectric characteristic of three-channel bulk charge-coupled device in the region of X-ray
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The numericla simulation of photoelectric characteristic of three-channel bulk charge-coupled device in the region of X-ray

机译:X射线区域三通道体电荷耦合器件光电特性的数值模拟

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In this paper the photoelectric characteristics of the three-channel bulk charge-coupled device (BCCD) was simulated in the region of X-ray. The results show that the silicon three-channel BCCD can not work in the region of X-ray because of improper absorption coefficient of silicon. The absorption coefficient curve of a new material is given in this paper. By using the absorption coefficient of the new materil, three maxim positions of the spectral photosensitivity are obtained at 1.8kev; 1.2kev and 0.6kev, respectively.
机译:本文在X射线区域模拟了三通道体电荷耦合器件(BCCD)的光电特性。结果表明,由于硅的吸收系数不合适,硅三通道BCCD无法在X射线区域工作。给出了一种新材料的吸收系数曲线。通过使用新物质的吸收系数,在1.8kev处获得了光谱光敏性的三个最大位置;分别为1.2kev和0.6kev。

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