首页> 外文会议>Conference on Holography and Diffractive Optics; 20071112-14; Beijing(CN) >Near field diffraction analysis and simulate about nanascale of Fresnel zone plate
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Near field diffraction analysis and simulate about nanascale of Fresnel zone plate

机译:菲涅耳波带片的纳尺度近场衍射分析与模拟

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In this paper, we calculated the numeric results of diffraction field in space of X-ray (λ=4.5nm) Fresnel zone plate based on angular spectrum method, analyzed the axial and radial distribution patterns of X-ray Fresnel zone plate. The Full Width at Half-Maximum (FWHM), Depth Of Focus (DOF) and Strehl efficiency of focus spot were studied. Discussed the relationships between FPZ's design parameter and focus spot properties. At the condition of λ=4.5nm and the outmost width Wn=50nm, the size of focus spot is proportional to the outmost width, and increase slowly with the increase of number of zones and focus length; the DOF of focus spot increase at first; when the focus length increased to 40μm, the DOF incline to a constant; the focus spot's Strehl efficiency increased slowly with the increase of number of zones and focus length.
机译:本文利用角谱法计算了X射线(λ= 4.5nm)菲涅耳波带片空间衍射场的数值结果,分析了X射线菲涅耳波带片的轴向和径向分布规律。研究了半最大全宽(FWHM),焦点深度(DOF)和焦点的Strehl效率。讨论了FPZ的设计参数和焦点属性之间的关系。在λ= 4.5nm,最大宽度Wn = 50nm的条件下,焦点的大小与最大宽度成正比,并且随着区域数量和焦点长度的增加而缓慢增加;首先增加焦点的自由度;当焦距增加到40μm时,自由度会趋于恒定。焦点的斯特雷尔效率随着区域数量和焦点长度的增加而缓慢增加。

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