首页> 外文会议>Conference on Electro-Optical System Design, Simulation, Testing, and Training, Jul 9-10, 2002, Seattle, Washington, USA >Double Effective Index Method and Scalar Beam-Propagation Method Analysis of Wavelength Shift for TE and TM Polarized Optical Fields
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Double Effective Index Method and Scalar Beam-Propagation Method Analysis of Wavelength Shift for TE and TM Polarized Optical Fields

机译:TE和TM偏振光场波长漂移的双有效折射率法和标量光束传播法分析

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摘要

We have applied the double effective index method to reduce the two-dimensional refractive index profile into the one-dimensional refractive index structure and modified the wave equations to obtain the paraxial wave equations. Then, TE and TM polarized fields in the curved single-mode planar waveguides are analyzed by using the scalar beam-propagation method employing the finite-difference method with a slab structure. The birefringence for TE and TM polarized fields in bent waveguides is calculated from the phase difference of the optical fields. The wavelength shift due to the birefringence of TE and TM polarized fields in bent waveguides is also calculated.
机译:我们已经应用了双重有效折射率方法将二维折射率分布简化为一维折射率结构,并修改了波动方程以获得近轴波动方程。然后,通过采用具有平板结构的有限差分方法的标量光束传播方法,分析弯曲的单模平面波导中的TE和TM偏振场。根据光场的相位差计算弯曲波导中TE和TM偏振场的双折射。还计算了弯曲波导中由于TE和TM偏振场的双折射而引起的波长偏移。

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