首页> 外文会议>Conference on Design and Microfabrication of Novel X-Ray Optics, Jul 9, 2002, Seattle, Washington, USA >High efficiency and low absorption Fresnel compound zone plates for hard X-ray focusing
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High efficiency and low absorption Fresnel compound zone plates for hard X-ray focusing

机译:高效和低吸收的菲涅耳复合带片,用于硬X射线聚焦

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Circular and linear zone plates have been fabricated on the surface of silicon crystals for the energy of 8 keV by electron beam lithography and deep ion plasma etching methods. Various variants of compound zone plates with first, second, third diffraction orders have been made. The zone relief height is about 10 mkm, the outermost zone width of the zone plate is 0.4 mkm. The experimental testing of the zone plates has been conducted on SPring-8 and ESRF synchrotron radiation sources. A focused spot size and diffraction efficiency measured by knife-edge scanning are accordingly 0.5 mkm and 39% for the first order circular zone plate.
机译:通过电子束光刻和深离子等离子体刻蚀方法,在硅晶体表面制备了8 keV能量的圆形和线性波带片。已经制成了具有第一,第二,第三衍射级的复合波带片的各种变型。区域起伏高度约为10 mkm,区域板的最外部区域宽度为0.4 mkm。在SPring-8和ESRF同步加速器辐射源上进行了带区板的实验测试。因此,对于一阶圆形波带片,通过刀口扫描测量的聚焦光斑尺寸和衍射效率为0.5 mkm,为39%。

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