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Effects of grid-placed contacts on circuit performance

机译:并网触点对电路性能的影响

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摘要

The impact of grid-placed contacts on application-specific integrated circuit (ASIC) performance is studied. Although snapping contacts to grid adds restrictions during layout design, smaller circuit area can be achieved by careful selection of the grid pitch, raising the lower limit of transistor width, applying double exposure, and shrinking the minimum contact pitch enabled by more effective application of resolution enhancement technologies. The technique is demonstrated on the contact level of 250-nm standard cells with the minimum contact pitch shrunk by 10%. The area change of 84 cells ranges from -20% to 25% with a median decrease of 5%. The areas of two circuits, a finite-impulse-response (FIR) filter and an add-compare-select (ACS) unit in the Viterbi decoder, decrease by 4% and 2% respectively. Delay and power consumption are also estimated to decrease with area.
机译:研究了网格放置的触点对专用集成电路(ASIC)性能的影响。尽管将触点扣紧到栅极上会增加布局设计的限制,但通过谨慎选择栅极间距,提高晶体管宽度的下限,施加两次曝光以及缩小更有效地应用分辨率所能达到的最小触点间距,可以实现较小的电路面积增强技术。在250-nm标准单元的接触水平上证明了该技术,最小接触间距缩小了10%。 84个单元的面积变化范围从-20%到25%,中位数下降5%。维特比解码器中的两个电路(有限脉冲响应(FIR)滤波器和加/比较选择(ACS)单元)的面积分别减少了4%和2%。估计延迟和功耗也会随着面积的增加而减少。

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