首页> 外文会议>Conference on advances in resist materials and processing technology XXVI; 20090223-25; San Jose, CA(US) >Incorporating Organosilanes into EUV Photoresists: Diphenyltrimethylsilylmethylsulfonium Triflate as a New PAG
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Incorporating Organosilanes into EUV Photoresists: Diphenyltrimethylsilylmethylsulfonium Triflate as a New PAG

机译:将有机硅烷掺入EUV光致抗蚀剂中:三氟甲磺酸二苯基三甲基甲硅烷基甲基s作为新型PAG

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摘要

The synthesis and characterization data for a new sulfonium photoacid generator (PAG), diphenyltrimethylsilylmethylsulfonium triflate (I), is reported. It is shown that the molecule undergoes rapid silyl group transfer to water or phenol in the presence of a strong, nucleophilic base such as trioctylamine (TOA). The resulting PAG, diphenyl-methylsulfonium triflate (II), is subsequently degraded by TOA via methyl group transfer from S to N leading to the formation of Ph_2S and methyltriocylammonium triflate. Both I and II are stable when non-nucleophilic base quenchers are used. Dose-to-clear and patterning results obtained from EUV exposures at Intel-MET are presented, illustrating that increased sensitivity can be obtained with PAGs I and II relative to triphenylsulfonium triflate (TPS-OTf), but that LWR is compromised.
机译:报道了新型sulf光产酸剂(PAG)三氟甲磺酸二苯基三甲基甲硅烷基甲基methyl的合成和表征数据。结果表明,在强的亲核碱(例如三辛胺(TOA))的存在下,分子经历了快速的甲硅烷基转移至水或苯酚的过程。所得的PAG,三氟甲磺酸二苯基-甲基TO(II)随后通过TOA经由从S到N的甲基转移而降解,导致形成Ph_2S和三氟甲磺酸三氰基铵。当使用非亲核碱基猝灭剂时,I和II均稳定。给出了从Intel-MET的EUV暴露获得的剂量到透明和图案化结果,表明PAG I和II相对于三氟甲磺酸三苯f(TPS-OTf)可以获得更高的灵敏度,但是LWR受到了损害。

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