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Effect of Electron Microscope Magnification on the Determination of Particle Size and Shape by Image Analysis

机译:电子显微镜放大倍数对图像分析确定粒径和形状的影响

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摘要

To investigate the effect of magnification (M) on determination of particle size and shape by transmission electron microscopy (TEM) and image analysis. The calibration curve and its simulative equation of TEM magnification are obtained by measurement of a grating replica standard specimen at different magnifications. Based on the analysis of TEM images at a series of magnifications for a 350nm-sphere standard sample, It has been found that the two errors of its size measurement, caused by one pixel change of the pixel number per particle diameter (Np) and by one gray value change during thresholding, is smaller, and the shape of 'circle' particles are close to the standard one, while Np is larger than 35. It can be seen that the suitable TEM magnification is in inverse proportion to particle size and it can be calculated by given equation.
机译:为了研究放大率(M)对通过透射电子显微镜(TEM)和图像分析确定粒度和形状的影响。通过在不同放大倍率下测量光栅复制标准样品,可以获得TEM放大倍率的校准曲线及其模拟方程。基于对350nm球形标准样品在一系列放大倍数下的TEM图像进行分析,发现其尺寸测量的两个误差是由每粒径(Np)的像素数一个像素变化和在阈值化过程中,一个灰度值变化较小,并且“圆形”颗粒的形状接近标准颗粒,而Np大于35。可以看出,合适的TEM放大率与颗粒大小成反比,并且可以通过给定的方程来计算。

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