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Direct selenium x-ray detector for fluoroscopy RF and radiography

机译:荧光透视R&F和射线照相的直接硒x射线检测器

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Abstract: The use of selenium alloys for direct conversion fluoroscopy flat-panel detectors has been underestimated. The purpose of this paper is to demonstrate the salient features of a selenium-based detector designed for R&F applications. The detector has an active area of 30 cm $MUL 27 cm and comprises 2048 $MUL 1792 pixels at 150 micrometer pitch. The geometric fill factor is 66%, but experimental evidence supports the fact that internal electric field bending leads to an effective fill factor approaching unity. The detector is designed to support full resolution images at 15 frames/second, and 896 $MUL 1024 resolution at 30 frames/second. The detector is coated with a simple coplanar 'p-i-n' selenium diode structure which has a dark current less than 100 pA/cm$+2$/. The thickness of this structure is 1000 micrometer to absorb 77% of a NEMA standard fluoroscopy beam. Measurements show we have obtained an x-ray sensitivity of 4400pC/mR/cm$+2$/, which translates to 1212 collected charges per absorbed x-ray. Resolution was measured to be near the theoretically predicted values, with a modulation of 63% at the Nyquist limit of 3.33 lp/mm. Phantom images were obtained at a frame rate of 15 frames per second, and negligible lag was observed in this image sequence. !15
机译:摘要:硒合金在直接转换荧光透视平板探测器中的使用被低估了。本文的目的是演示专为R&F应用设计的基于硒的探测器的显着特征。该探测器的有效面积为30 cm $ MUL 27 cm,包括2048 $ MUL 1792像素(150微米间距)。几何填充系数为66%,但是实验证据支持以下事实:内部电场弯曲会导致有效填充系数接近于1。该检测器旨在以15帧/秒的速度支持全分辨率图像,以30帧/秒的速度支持896 $ MUL 1024分辨率。该探测器涂有简单的共面“ p-i-n”硒二极管结构,其暗电流小于100 pA / cm $ + 2 $ /。该结构的厚度为1000微米,可吸收77%的NEMA标准荧光透视光束。测量表明,我们获得的X射线灵敏度为4400pC / mR / cm $ + 2 $ /,相当于每个吸收的X射线收集了1212个电荷。测得的分辨率接近理论上的预测值,在3.33 lp / mm的奈奎斯特极限下调制为63%。以每秒15帧的帧速率获得幻影图像,并且在此图像序列中观察到的滞后可以忽略不计。 !15

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