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Accurately nonselective and selective etching of GaAs/Al_(0.8)Ga_(0.2)As/AlAs structure for making air-gap cavity

机译:GaAs / Al_(0.8)Ga_(0.2)As / AlAs结构的精确非选择性和选择性刻蚀,用于制造气隙腔

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摘要

We have demonstrated a wet etching technique capable of fabricating air-gap cavity. The process utilizes nonselective and selective etchants respectively to form air-gap cavity. The etching characteristics of GaAs/Al_(0.8)Ga_(0.2)As/AlAs structure in different nonselective and selective etchants are investigated. The volumetric 3:2:20 ratios of H_3PO_4/H_2O_2/H_2O solution and volumetric 600:1 ratio of DI water/buffered oxide [mixture of 7:1 NH_4F(36%)-HF(6.4%)] solution are better nonselective and selective etchants respectively. We have used this process technique to form a tunable air-gap cavity optical filter. The measure results of the transmission spectral show that the air-gap cavity has high optical quality. These simple etching processes can be applied to fabricate the air-gap cavity devices.
机译:我们已经证明了能够制造气隙腔的湿法蚀刻技术。该工艺分别利用非选择性和选择性蚀刻剂形成气隙腔。研究了GaAs / Al_(0.8)Ga_(0.2)As / AlAs结构在不同非选择性和选择性腐蚀剂中的腐蚀特性。 H_3PO_4 / H_2O_2 / H_2O溶液的体积比3:2:20和去离子水/缓冲氧化物[7:1 NH_4F(36%)-HF(6.4%)的混合物]的体积比600:1更好的非选择性和选择性蚀刻剂。我们已经使用这种工艺技术来形成可调气隙腔滤光器。透射光谱的测量结果表明,气隙腔具有较高的光学质量。这些简单的蚀刻工艺可以应用于制造气隙腔装置。

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