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High-Performance Metamorphic InP/GaAsSb/InP 'Type-Ⅱ' DHBTs Grown on GaAs Substrates

机译:GaAs衬底上生长的高性能变质InP / GaAsSb / InP'Ⅱ型'DHBT

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摘要

We report the fabrication of high-performance metamorphic (MM) InP/GaAsSb/InP DHBTs grown on GaAs substrates which show performances comparable or, in certain respects, superior to similar structures grown on InP substrates. The emitter base junction non-ideality factor is found to be significantly higher in the MM devices when compared to the lattice-matched layers: this is believed related to a significantly rougher emitter base junction compared to layers grown lattice-matched on InP. Current gain cutoff frequencies f_T as high as 110 GHz have been achieved with a 30 nm base and a 200 nm collector.
机译:我们报告了在GaAs衬底上生长的高性能变质(MM)InP / GaAsSb / InP DHBT的制造,这些性能显示出与InP衬底上生长的类似结构相当或在某些方面更好的性能。与晶格匹配层相比,在MM器件中发现发射极基极结非理想因素要高得多:与在InP上生长的晶格匹配层相比,这被认为与发射极基极结更粗糙有关。使用30 nm的基极和200 nm的集电极可以实现高达110 GHz的电流增益截止频率f_T。

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