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Probing the Behaviors of Point Defects in Silicon and Germanium Using Isotope Superlattices

机译:用同位素超晶格探测硅和锗中的点缺陷行为

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摘要

In order to probe the fundamental behaviors of point defects in silicon and germanium, we studied the self-diffusion using isotope superlattices. In ion-implanted germanium, vacancies are in thermal equilibrium and transient enhanced diffusion is not present under the experimental conditions employed in this study. In contrast, silicon self-interstitials are supersaturated in ion-implanted silicon and the self-interstitial concentration is going down to the thermal equilibrium value toward the surface.
机译:为了探究硅和锗中点缺陷的基本行为,我们使用同位素超晶格研究了自扩散。在离子注入的锗中,空位处于热平衡状态,并且在本研究采用的实验条件下不存在瞬态增强的扩散。相反,硅自填隙在离子注入的硅中过饱和,自填隙浓度朝着表面下降至热平衡值。

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  • 来源
  • 会议地点 Vienna(AT);Vienna(AT);Berlin(DE)
  • 作者单位

    Department of Applied Physics and Physico-Informatics, Keio University, Yokohama 223-8522, Japan;

    rnDepartment of Applied Physics and Physico-Informatics, Keio University, Yokohama 223-8522, Japan;

    rnDepartment of Applied Physics and Physico-Informatics, Keio University, Yokohama 223-8522, Japan;

    rnDepartment of Applied Physics and Physico-Informatics, Keio University, Yokohama 223-8522, Japan;

    rnResearch Center for Silicon Nano-Science, Tokyo City University, Tokyo 158-0082, Japan;

    rnResearch Center for Silicon Nano-Science, Tokyo City University, Tokyo 158-0082, Japan;

    rnLawrence Berkeley National Laboratory and University of California at Berkeley, California 94720, USA;

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  • 正文语种 eng
  • 中图分类 材料;
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