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X-ray Stress Measurement for Ni-Al System Intel-metallic Compound Prepared by SHS- method

机译:SHS-方法制备的镍铝体系英特尔金属化合物的X射线应力测量

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摘要

An X-ray diffraction technique was used to measure the residual stress in the surface of a specimen containing a coating of a Ni_3Al intermetallic compound produced bythe SHS (Self-propagation High temperature Synthesis) method. The Ni_3Al was using the coating material for spherical carbon cast iron substrate and austenite stainless steel substrate. Differences between the coefficient of thermal expansion of the coating and substrate were c onfirmed to be the source of compression stress in the coating.
机译:使用X射线衍射技术测量包含通过SHS(自蔓延高温合成)方法生产的Ni_3Al金属间化合物涂层的样品表面的残余应力。 Ni_3Al用作球形碳铸铁基底和奥氏体不锈钢基底的涂层材料。确认涂层和基材的热膨胀系数之间的差异是涂层中压缩应力的来源。

著录项

  • 来源
  • 会议地点 Steamboat Springs CO(US);Steamboat Springs CO(US);Steamboat Springs CO(US)
  • 作者单位

    Graduate student of Kanazawa University, Kakumamachi Kanazawa Ishikawa 920-1192, Japan;

    Graduate student of Kanazawa University, Kakumamachi Kanazawa Ishikawa 920-1192, Japan;

    Dept. of Material Science and Engineering, Kanazawa University, Kakumamachi Kanazawa Ishikawa 920-1192, Japan;

    Kinjo University research center, Kasamamachi 1200, Matto, Ishikawa 924-8511,Japan;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 X射线、紫外线、红外线;
  • 关键词

  • 入库时间 2022-08-26 14:25:09

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