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Study of the correlation between doped MgO workfunction and address delay

机译:掺杂MgO功函数与地址延迟的相关性研究

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摘要

The MgO protective layer of PDP has a strong influence on address delay. The relation, however, is not clearly understood due to the difficulty of analysis which is caused by surface charging. This paper suggests a way to avoid the charging problem and shows the correlation between workfunction measured by UPS and address delay.
机译:PDP的MgO保护层对地址延迟有很大的影响。然而,由于由表面带电引起的分析困难,因此没有清楚地理解该关系。本文提出了一种避免充电问题的方法,并显示了UPS测量的功函数与地址延迟之间的相关性。

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