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Chemical Composition Profiles across Grain Boundaries in T6, T79 and T76 Tempered AA7449 Alloy

机译:T6,T79和T76淬火AA7449合金中晶界的化学成分分布

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EDX spectroscopy is carried out to trace chemical composition profiles across the grain boundary in three different tempers : T651(peak aged), T7951 (slightly over-aged) and T7651 (over-aged) and for three plate thicknesses : 10 mm, 15 mm and 25 mm. Quantitative assessment of the concentration profiles indicates : (1) The concentration variation of Zn across the grain boundary is much more marked than that of Mg or Cu, irrespective of the aging and quenching conditions. (2) The minimal concentration of Zn occurring in the matrix decreases significantly on passing from T651 to T7951, as is the case for the minima observed in the PFZ. (3) The variation of the minimal concentration of Cu and Mg is less marked than that of Zn. Nevertheless, a trend of lowering with over-ageing is observed for the minima occurring in the PFZ, as well as in the matrix.
机译:进行EDX光谱分析以追踪三种不同温度下的晶界的化学成分分布:T651(峰值时效),T7951(略微时效)和T7651(时效)以及三种板厚:10 mm,15 mm和25毫米对浓度分布的定量评估表明:(1)不论时效和淬火条件如何,整个晶界上Zn的浓度变化都比Mg或Cu明显得多。 (2)与从PFZ中观察到的最小值一样,从T651到T7951时,基体中最低的Zn浓度显着降低。 (3)Cu和Mg的最低浓度的变化不如Zn明显。不过,对于PFZ和矩阵中出现的最小值,观察到了随着老化而降低的趋势。

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