NEW GENERATION OF CLUSTERABLE IN-FEEP EMITTERS

摘要

Based on the lessons learned during the GOCE Microthruster Program, ARC Seibersdorf research is now developing a new generation of clusterable In- FEEP emitters, which shall enable an operation with a single PCU with drastically reduced costs and complexity, and shall operate each single emitter within the cluster at a low and thus safe thrust level. A cluster of these new emitters will allow thrust levels higher than 100 μN and increased total impulse capability. rnThis paper presents an overview of the lessons learned during the GOCE activity, their implementation on the design of the new emitters, preliminary results which include a 1500h endurance test of the single emitters, as well as a characterization of a first cluster prototype.