首页> 外文会议>49th Annual International Relay Conference Apr 23-25, 2001 Oak Brook, IL >Bringing simplicity and clarity back into the parametric and life-testing of relay devices
【24h】

Bringing simplicity and clarity back into the parametric and life-testing of relay devices

机译:使继电器设备的参数化和寿命测试变得简单明了

获取原文
获取原文并翻译 | 示例

摘要

This paper outlines the strides that our company has made to bring back simplicity of testing to relay devices, particularly for the less automated production test situations where only partly skilled personnel are employed. Examples will be shown of improvements to the presentation of relay data and to the ways in which actual relay test systems are constructed. The techniques outlined in this paper will be shown to take us back towards the clarity and customisation that test engineers expect from in-house built equipment and which allow Applied Relay Testing to offer commercially as a professional product at an economic cost.
机译:本文概述了我们公司在使继电器设备的测试简单性方面所取得的进步,特别是对于仅使用部分熟练技术人员的自动化程度较低的生产测试情况。将举例说明改进中继数据表示和改进实际中继测试系统的方式。本文中概述的技术将使我们回到测试工程师希望从内部建造的设备中获得的清晰度和定制化,并使应用继电器测试能够以经济的成本作为专业产品提供商业服务。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号