首页> 外文会议>42nd international symposium on microelectronics (IMAPS 2009) >Effect of Germanium addition to Sn3.5Ag Lead Free Solder System for Overall BGA Package Robustness Improvement
【24h】

Effect of Germanium addition to Sn3.5Ag Lead Free Solder System for Overall BGA Package Robustness Improvement

机译:Sn3.5Ag无铅焊料系统中添加锗对整体BGA封装稳健性的影响

获取原文
获取原文并翻译 | 示例

摘要

A study was conducted on BGA lead-free C5 solder joint system to assess the effect ofrnGermanium addition to Sn3.5Ag solder alloy through comparison study of Sn3.5Ag vs.rnSn3.5AgGe. The main objective of this study is to find a way to resolve solder surface oxidationrnafter thermal processes, while determining if there’s any adverse effect on the solder joint byrnGermanium addition. The result of this study showed that addition of Germanium in Sn3.5Ag C5rnsolder system resolved solder surface oxidation after thermal processes, without any negativernimpact to the solder joint and solderability. Experimental works were carried out to observe thernmelting properties and solder surface morphology by Differential Scanning Calorimetry (DSC) andrnSEM. Solder surface oxidation was measured by EDX. Shear and pull strength was measured byrnDage which is representative of the intermetallic (IMC) strength between the C5 solder spherernand Cu/Ni/Au pad finishing. Solderability test was conducted per Jedec standard. Tray andrnPackaging Drop Tests were done to gauge solder joint performance against impact force. Arncomprehensive study was done to study the effect of microstructure and interface intermetallic ofrnboth solder system at ambient, high temperature storage (HTS) at 150℃ for 24, 48, 96, 168, 504rnand 2000 hours and multiple reflow of 1x, 2x, 3x, 6x towards the joint integrity. In each read point,rnSn3.5AgGe has significantly higher ball shear and ball pull strength. EPMA microstructurernanalysis after cross-sectioning on bulk solder and IMC revealed traces of Germanium thatrncontributed to the significant increase in ball shear and ball pull strength, while did not cause anyrnbulk solder and IMC morphology changes. Both solderability and drop test passed. In conclusion,rnaddition of Germanium in Sn3.5Ag lead-free solder is able to resolve surface oxidation problemrnafter thermal processing, with improvement in solder joint strength for overall lead-free packagernrobustness.
机译:通过对Sn3.5Ag与rnSn3.5AgGe的对比研究,对BGA无铅C5焊点系统进行了研究,以评估在Sn3.5Ag焊料合金中添加rn锗的效果。这项研究的主要目的是找到一种解决热处理后焊料表面氧化的方法,同时确定添加锗对焊点是否有不利影响。这项研究的结果表明,在Sn3.5Ag C5solder系统中添加锗可以解决热处理后的焊料表面氧化,而对焊点和可焊性没有任何负面影响。通过差示扫描量热法(DSC)和rnSEM进行了实验研究,以观察其熔融性能和焊料表面形态。焊料表面氧化通过EDX测量。剪切强度和拉伸强度通过rnDage测量,该值代表C5焊料球与Cu / Ni / Au焊盘精加工之间的金属间(IMC)强度。可焊性测试是根据Jedec标准进行的。进行了托盘和包装跌落测试,以评估焊点相对于冲击力的性能。进行了全面的研究,研究了两种焊料系统的微结构和界面金属间化合物在150℃,环境高温存储(HTS)下持续24、48、96、168、504rn和2000小时以及1x,2x,3x多次回流的影响。关节完整性提高6倍。在每个读取点,rnSn3.5AgGe具有明显更高的滚珠剪切强度和拉拔强度。对散装焊料和IMC进行横截面分析后的EPMA微结构分析表明,痕量的锗有助于球剪切和球拉强度的显着提高,而没有引起大量的焊料和IMC形态变化。通过了可焊性和跌落测试。总之,在Sn3.5Ag无铅焊料中添加锗能够解决热处理后的表面氧化问题,并提高了焊点强度,从而提高了无铅封装的整体坚固性。

著录项

  • 来源
  • 会议地点 San Jose CA(US);San Jose CA(US)
  • 作者单位

    Faculty of Engineering, Department of Electrical, Electronics System, National University of Malaysia 43600 Bangi, Selangor, Malaysia Tel: 603-89216322 Fax: 603-89216146rnFreescale Semiconductor, (M) Sdn. Bhd. No. 2, Jalan SS 8/2 Free Industrial ZonernSungei Way Petaling Jaya 47300 Tel: 603-78823790 Email: r38158@freescale.com;

    rnFaculty of Engineering, Department of Electrical, Electronics System, National University of Malaysia 43600 Bangi, Selangor, Malaysia Tel: 603-89216322 Fax: 603-89216146rnFreescale Semiconductor, (M) Sdn. Bhd. No. 2, Jalan SS 8/2 Free Industrial ZonernSungei Way Petaling Jaya 47300 Tel: 603-78823790;

    rnFreescale Semiconductor, (M) Sdn. Bhd.rnNo. 2, Jalan SS 8/2 Free Industrial ZonernSungei Way Petaling Jaya 47300rnTel: 603-78823790;

    rnFaculty of Engineering, Department of Electrical, Electronics System, National University of Malaysia 43600 Bangi, Selangor, Malaysia Tel: 603-89216322 Fax: 603-89216146;

    rnFaculty of Engineering, Department of Electrical, Electronics System, National University of Malaysia 43600 Bangi, Selangor, Malaysia Tel: 603-89216322 Fax: 603-89216146;

    rnFaculty of Engineering, Department of Materials Engineering,rnUniversity Malaya MalaysiarnKL, Selangor, Malaysia;

    rnFaculty of Engineering, Department of Materials Engineering,rnUniversity Malaya MalaysiarnKL, Selangor, Malaysia;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC) ;
  • 关键词

    germanium, BGA packaging, lead-free C5, surface oxidation, intermetallic; Sn3.5Ag, shear and pull strength;

    机译:锗,BGA封装,无铅C5,表面氧化,金属间化合物; Sn3.5Ag,剪切和拉伸强度;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号