首页> 外文会议>The 41st IEEE International Conference on Plasma Science, and the 20th International Conference on High-Power Particle Beams >Comparison of plasma sources for surface treatment applications: Radiofrequency inductively coupled and surface-wave microwave plasma sources
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Comparison of plasma sources for surface treatment applications: Radiofrequency inductively coupled and surface-wave microwave plasma sources

机译:用于表面处理的等离子源的比较:射频感应耦合和表面波微波等离子源

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Summary form only given. This work was conducted within the framework of PAUD (Plasma Airborne molecular contamination Ultra Desorption), a collaborative program funded by OSEO and certified by French global competitive clusters Minalogic and Trimatec. The main object of interest is to develop new technology bricks for next generation molecular decontamination systems. As part of our research effort in evaluating the potential of plasma treatment as a solution, the performance of different plasma sources was evaluated.Here, we will show the electronic density and temperature radial profiles, as well as plasma emission at different locations obtained with both plasma sources. The results will be presented as a function of sources injected power (up to 2 kW), argon gas flow (10 ~ 300 sccm) and pressure (5 10-3 ~5 10-1 mbar).
机译:仅提供摘要表格。这项工作是在PAUD(等离子体空气传播的分子污染超解吸)框架内进行的,PAUD是一项由OSEO资助,并由法国全球竞争性集群Minalogic和Trimatec认证的合作计划。感兴趣的主要目的是开发用于下一代分子去污系统的新技术砖。作为评估等离子解决方案潜力的研究工作的一部分,我们评估了不同等离子源的性能。在此,我们将显示电子密度和径向温度分布图,以及在这两种情况下获得的不同位置的等离子发射等离子体源。结果将作为源注入功率(最大2 kW),氩气流量(10〜300 sccm)和压力(5 10-3〜5 10-1 mbar)的函数表示。

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