首页> 外文会议>26th Annual Meeting of the Adhesion Society, Inc. Feb 23-26, 2003 Myrtle Beach, SC >INITIATION OF INTERFACIAL DELAMINATIONS RELAVANT TO FLIP-CHIP ASSEMBLIES
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INITIATION OF INTERFACIAL DELAMINATIONS RELAVANT TO FLIP-CHIP ASSEMBLIES

机译:与FLIP-CHIP组件相关的界面分层的初始化

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The ADCB and TBJ results for monotonic adhesion testing correlate well, indicating that similar interfacial interactions play a part in both tests. The preliminary fatigue TBJ results show a linear trend under low cycle fatigue, with future testing to encompass higher cycle fatigue. Continued initiation testing will be done on other butt joint geometries (corner, embedded edge, and embedded corner singularity types) as well as flip-chip type geometries that will be tested under both thermal and mechanical fatigue conditions
机译:单调粘附力测试的ADCB和TBJ结果具有良好的相关性,表明在两种测试中相似的界面相互作用都起着重要作用。初步疲劳TBJ结果在低循环疲劳下显示出线性趋势,未来的测试涵盖了较高的循环疲劳。将在其他对接几何形状(角,嵌入的边缘和嵌入的角奇点类型)以及倒装芯片类型的几何形状(将在热疲劳和机械疲劳条件下进行测试)上继续进行初始测试

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