Specifications and Test Methods of Ceramic Multilayer Capacitors with Ultrathin Dielectric Layers

摘要

Present state-of-the-art MLCC technology makes it possible to realise capacitors with dielectric thickness down to 2 μm These advanced products, focussing on high-capacitance (above 1μF) and low voltage applications (below 10V), are competing with Tantalum or dry Aluminium electrolytic capacitors. Not only the physical characteristics, but also the specifications and test methods differ in many aspects between ceramic dielectrics and electrolytic capacitors, making it increasingly difficult to the compare product performances. Developments of advanced Tantalum capacitors and MLCC's with ultra thin dielectrics lead to adaptations of specifications. International standardisation organisations (IEC, EIA, EIAJ) face difficulties in updating specifications at the speed of new developments. Moreover, specification guidelines continue to be technology related in stead of application related. Guidelines for specifying capacitors related to the application should be developed. This contribution will outline some of these important application related properties of advanced multilayer ceramic capacitors in comparison with Tantalum capacitors. Suggested for new specifications methods and product opportunities based on application based specifications will be presented.