Department of Product, Test and Failure Analysis, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Wintech Nano-Technology Service Pte Ltd, 117684, Singapore;
School of Materials Science Engineering, College of Engineering, Nangyang Technologic University, 639798, Singapore;
Department of Product, Test and Failure Analysis, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Department of Product, Test and Failure Analysis, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Department of Quality, Reliability and Assurance, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Department of Product, Test and Failure Analysis, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Department of Product, Test and Failure Analysis, Globalfoundries Singapore Pte Ltd, 738406, Singapore;
Failure analysis; Scanning electron microscopy; Electron beams; Strain; Atomic measurements; Scattering;
机译:电子射线辐射诱导氮化硅的劣化及其对半导体破坏分析的影响
机译:电子材料的低温FIB-SEM失效分析
机译:针对术中电子放射治疗中的降低风险干预措施的失败模式和效果分析:患者运输,自动化和治疗计划可用性的特定影响
机译:电子辐射对SEM,FIB和TEM对半导体失效分析的影响的概述
机译:无机卤化物钙酸盐作为硬质辐射检测的半导体的合成,晶体生长和光电子表征
机译:中子辐照超细晶粒石墨的氮吸附数据FIB-SEM断层扫描和TEM显微照片
机译:利用聚焦离子束(FIB)和透射电子显微镜(TEM)对从航天飞机哥伦比亚窗残骸获得的焦炭沉积物进行失效分析
机译:利用聚焦离子束(FIB)和透射电子显微镜(TEm)对航天飞机哥伦比亚号窗碎片中的炭沉积物进行失效分析