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2D RF Electronics: from devices to circuits - challenges and applications

机译:2D RF电子产品:从设备到电路-挑战与应用

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摘要

We developed process technologies dedicated to high frequency graphene field-effect transistors (GFETs). We used graphene from different sources (graphene growth directly on silicon carbide (SiC) substrate by chemical vapor deposition (CVD) technique [1], CVD graphene growth on Cu foil and transferred on Si02/Si substrate [2]) to realize two GFET structures (top gate and back gate transistors). After fabrication, we have explored the high frequency performances of GFETs including noise performances. The performances of GFET achieved are comparable to the state of the art with the gate length. The noise parameters of the transistors are mandatory for circuit design (linear application such as amplifier). These parameters limit the performances of the device when small signals are considered. The effort was made here to measure the noise parameters of GFETn$(mathrm{NF}_{min}, mathrm{R}_{mathrm{n}}, Gamma_{mathrm{opt}})$n. It is well known that these parameters depend both on intrinsic properties of the graphene material (noise generated in the channel under the gate), as well as extrinsic parameters related to the technological process (mainly noise generated by access resistances, …). Based on the reliability of the process, RF circuits were designed and fabricated. These circuits demonstrated the potential to achieve high performances in the field of linear circuit such as amplifiers, and non-linear circuits such as mixers.
机译:我们开发了专用于高频石墨烯场效应晶体管(GFET)的处理技术。我们使用来自不同来源的石墨烯(通过化学气相沉积(CVD)技术直接在碳化硅(SiC)衬底上生长石墨烯[1],在Cu箔上生长CVD石墨烯并转移到Si02 / Si衬底上[2])来实现两个GFET结构(顶栅和背栅晶体管)。制作后,我们探索了GFET的高频性能,包括噪声性能。在栅极长度方面,GFET的性能可与现有技术相媲美。晶体管的噪声参数对于电路设计(线性应用,例如放大器)是必不可少的。当考虑小信号时,这些参数限制了设备的性能。在此努力测量GFETn $(mathrm {NF} _ {min},mathrm {R} _ {mathrm {n}},Gamma_ {mathrm {opt}})$ n。众所周知,这些参数既取决于石墨烯材料的固有特性(在栅极下方的通道中产生的噪声),又取决于与工艺过程相关的外部参数(主要是由访问电阻产生的噪声等)。基于工艺的可靠性,设计和制造了射频电路。这些电路展示了在线性电路(例如放大器)和非线性电路(例如混频器)领域实现高性能的潜力。

著录项

  • 来源
  • 会议地点 Santa Barbara(US)
  • 作者单位

    IEMN, CNRS UMR8520, Avenue Poincaré, University of Lille, CS 60069,59652 Villeneuve d' Ascq, France;

    IEMN, CNRS UMR8520, Avenue Poincaré, University of Lille, CS 60069,59652 Villeneuve d' Ascq, France;

    IEMN, CNRS UMR8520, Avenue Poincaré, University of Lille, CS 60069,59652 Villeneuve d' Ascq, France;

    Department of Microtechnology and Nanoscience, Chalmers University of Technology, Gothenburg, SE-412 96, Sweden;

    Department of Microtechnology and Nanoscience, Chalmers University of Technology, Gothenburg, SE-412 96, Sweden;

    Department of Microtechnology and Nanoscience, Chalmers University of Technology, Gothenburg, SE-412 96, Sweden;

    IMS, CNRS UMR 5218, University of Bordeaux, Bât. A31,351Cours de la Liberation, Talence, 33400, France;

    IMS, CNRS UMR 5218, University of Bordeaux, Bât. A31,351Cours de la Liberation, Talence, 33400, France;

    IEMN, CNRS UMR8520, Avenue Poincaré, University of Lille, CS 60069,59652 Villeneuve d' Ascq, France;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Logic gates; Graphene; Performance evaluation; Transmission line measurements; Transistors; Substrates; Mixers;

    机译:逻辑门;石墨烯;性能评估;传输线测量;晶体管;基板;混频器;;

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