Dadoria Department of Electronics and Communication Engineering, Maulana Azad National Institute of Technology, Bhopal, (M.P.) India-462003;
Dadoria Department of Electronics and Communication Engineering, Maulana Azad National Institute of Technology, Bhopal, (M.P.) India-462003;
Dadoria Department of Electronics and Communication Engineering, Maulana Azad National Institute of Technology, Bhopal, (M.P.) India-462003;
Logic gates; CNTFETs; Power demand; Delays; Leakage currents; Conferences;
机译:一种新的基于泄漏的高速比较器多米诺骨牌门,用于低功耗VLSI电路的宽扇入或逻辑
机译:用于宽敞的风扇或栅极的新工艺变化和泄漏耐漏电片电路
机译:采用电压比较的新型耐泄漏多米诺骨牌电路,适用于深亚微米技术中的宽扇入式浇口
机译:具有CNTFET的宽敞粉丝宽敞的漏宽Domino电路
机译:具有无限扇入门的恒定深度布尔电路的可满足性算法。
机译:神经回路:离子通道噪声对神经回路的影响:在呼吸模式发生器上的应用用于研究呼吸变异性
机译:适用于70nm CMOS技术的高扇入应用的高速和耐泄漏多米诺电路