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DRAM row-hammer attack reduction using dummy cells

机译:使用虚拟单元减少DRAM行锤攻击

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This paper describes a low-cost and low-complexity alternative to reduce the occurrence of Row-Hammer attacks. The detection of an undesired attack is based on the use of an additional memory cell - called dummy cell -, with a larger leakage current and thus a higher sensitivity to crosstalk and coupling noise. This characteristic is achieved due to the use of a wider pass transistor and a smaller storage capacitor. One of the most relevant aspects of this solution is the involved additional low-complexity hardware, occupying less than 0.1% of the whole memory. In addition, the dummy cells can be distributed across the whole memory to hinder hackers identification. Simulations on a 65nm CMOS process were done in order to validate the proposed alternative. Process variations for coupling and interconnections were taken into account in a 64×64 memory array, so that the results keep congruence with a memory dedicate, state-of-art, 28nm process.
机译:本文介绍了一种低成本和低复杂度的替代方法,可以减少Row-Hammer攻击的发生。对不希望的攻击的检测是基于使用额外的存储单元(称为虚拟单元)而进行的,该存储单元具有较大的泄漏电流,因此对串扰和耦合噪声的敏感性更高。通过使用更宽的传输晶体管和更小的存储电容器,可以实现此特性。此解决方案最相关的方面之一是所涉及的其他低复杂度硬件,仅占整个内存的不到0.1%。此外,伪单元可以分布在整个内存中,以防止黑客识别。为了验证所提出的替代方案,在65nm CMOS工艺上进行了仿真。在64×64存储器阵列中考虑了耦合和互连的工艺差异,因此结果与存储器专用的最新28nm工艺保持一致。

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