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Modeling study of the mobility in FDSOI devices with a focus on near-spacer-region

机译:FDSOI设备中迁移率的建模研究,重点放在近间隔区域

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We have studied the mobility in the FDSOI devices as a function of silicon thickness, doping, surface orientation and applying different back biases. This study is also done in the near-spacer-region that is partially inverted. Simulations have been obtained with a self-consistent Poisson-Schrödinger which provides a precise energy distribution of carriers and, allied to a Kubo-Greenwood carrier mobility solver, performs a quantum corrected drift diffusion (QCDD) model, capable of capturing non local effects on transport (tunneling) and mobility (influence of geometry).
机译:我们已经研究了FDSOI器件中的迁移率与硅厚度,掺杂,表面取向以及施加不同的背偏置的关系。这项研究也在部分倒置的近间隔区域进行。使用自洽的Poisson-Schrödinger获得了仿真,该Poisson-Schrödinger提供了精确的载流子能量分布,并且与Kubo-Greenwood载流子迁移率求解器一起执行了量子校正的漂移扩散(QCDD)模型,该模型能够捕获非局部效应。运输(隧穿)和流动性(几何形状的影响)。

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