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Nanowires piezoelectric constants determination using current-voltage measurements

机译:使用电流-电压测量确定纳米线的压电常数

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This work demonstrates an original method using the electromechanical properties of the zinc oxide (ZnO) piezoelectric nanowires to characterize its piezoelectric voltage coefficient (d). The proposed technique utilizes the current-voltage (IV) measurements coupled with the application of variable force to cause a change in the corresponding IV relationship. To conduct the IV measurements, the nanowire is integrated inside a field effect transistor (FET) to form the channel of the device, while it is suspended over a trench. The indentation of the nano-wire causes the mechanical deflection of the suspended nanowire which through the piezoelectric effect changes the IV characteristics of the FET. The extraction of the piezoelectric coefficient is done by modifying the standard FET IV model to incorporate the change in the channel length which is triggered by the piezoelectric behavior. Embedded within this change of length is piezoelectric coefficient and therefore, it becomes straightforward procedure to extract this coefficient from the changes in the IV characteristics.
机译:这项工作展示了一种利用氧化锌(ZnO)压电纳米线的机电性能表征其压电电压系数(d)的原始方法。所提出的技术利用电流-电压(IV)测量结果以及可变力的施加来引起相应IV关系的变化。为了进行IV测量,将纳米线集成在场效应晶体管(FET)内以形成器件的沟道,同时将纳米线悬挂在沟槽上。纳米线的压痕引起悬浮的纳米线的机械偏转,其通过压电效应改变了FET的IV特性。压电系数的提取是通过修改标准FET IV模型以纳入由压电行为触发的沟道长度变化来完成的。压电系数嵌入到这种长度变化中,因此,从IV特性的变化中提取该系数成为简单的过程。

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