首页> 外文会议>2015 IEEE 11th International Conference on the Properties and applications of Dielectric Materials >A study on flashover characteristics of supporting insulators in SF6 under lightning impulse
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A study on flashover characteristics of supporting insulators in SF6 under lightning impulse

机译:雷电冲击下SF 6 支撑绝缘子的闪络特性研究

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In recent years, SF gas insulated switchgear (GIS) is increasingly widely used among the power system of China and the flashover characteristics on GIS insulator have attracted widely attention of many researchers. According to the previous research, it's found that surface conditions of the insulators have a great impact on flashover voltage. In this paper, the influence of the surface roughness of the insulator on its flashover characteristics in SF had been studied. A 1000kV standard lightning impulse (SLI) generator was constructed to study the influence of surface roughness of insulators on flashover voltage under SLI. 72.5kV supporting insulators with different roughness were obtained by polishing the surface with different mesh numbers of abrasive paper. A laser scanning confocal microscope (LSCM) was used to observe the roughness of the insulator. The results showed that the flashover voltage of insulator increases within the SF pressure ranges from 0.1MPa to 0.4MPa under SLI and decreases with the increasing surface roughness. This phenomenon was analyzed in consideration of the surface area and adsorption. It's also found that the roughness has a bigger impact on the flashover voltage under the negative SLI. The flashover voltage of rough insulator under negative SLI is higher than that under positive SLI, which is different from the flashover characteristics of the new smooth insulator.
机译:近年来,SF气体绝缘开关设备(GIS)在中国的电力系统中越来越广泛地使用,并且GIS绝缘子的闪络特性引起了许多研究人员的广泛关注。根据先前的研究,发现绝缘子的表面状况对闪络电压有很大的影响。在本文中,研究了绝缘子的表面粗糙度对其在SF中闪络特性的影响。为了研究绝缘子表面粗糙度对SLI下闪络电压的影响,建立了1000kV标准雷电脉冲发生器。通过用不同目数的砂纸打磨表面,可得到具有不同粗糙度的72.5kV支撑绝缘子。用激光扫描共聚焦显微镜(LSCM)观察绝缘子的粗糙度。结果表明,在SLI条件下,绝缘子的闪络电压在SF压力从0.1MPa至0.4MPa的范围内增加,并随表面粗糙度的增加而降低。考虑到表面积和吸附,对该现象进行了分析。还发现,粗糙度在负SLI下对闪络电压有较大影响。负SLI下粗糙绝缘子的闪络电压高于正SLI下的闪络电压,这与新型光滑绝缘子的闪络特性不同。

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