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The application of fault tree analysis method in electrical component

机译:故障树分析方法在电气元件中的应用

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摘要

Fault tree analysis is a method which is widely used in analysis and forecasting system security and reliability. This analysis method is also applicable for reliability analysis of components. It is first time in domestic to apply FTA techniques to electronic components in this paper. It also introduced the fault tree analysis method for electronic components in detail, including fault tree artificial construction method, qualitative analysis and quantitative analysis methods, which took the failure mode “short” for semiconductor device as an example. According to fault tree analysis for electronic components, it can identify possible failure causes, analyze the major failure causes and present corresponding measures to prevent component failure.
机译:故障树分析是一种广泛用于分析和预测系统安全性和可靠性的方法。该分析方法也适用于部件的可靠性分析。本文首次将FTA技术应用于电子元件在国内。还详细介绍了电子元器件的故障树分析方法,包括故障树人工构造方法,定性分析和定量分析方法,以半导体器件的“短路”故障模式为例。根据电子零件的故障树分析,可以找出可能的故障原因,分析主要的故障原因,并提出相应的措施来防止零件故障。

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