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Improving flow line scheduling by upstream mixed integer resource allocation in a wafer test facility

机译:通过晶圆测试设施中的上游混合整数资源分配来改善流水线调度

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The effort for scheduling real manufacturing systems is generally very high for mathematical as well as for simulation-based methods. Combining both methods is the key for solving complex scheduling problems. The paper introduces a special approach, where at first a static resource allocation problem is solved by mixed integer programming (MIP). Based on the resulting reduced dedication matrices, feasible schedules are then generated by a discrete event simulation (DES). Possible applications can be found in many parts of the semiconductor manufacturing process, for example in the wafer test. The investigated wafer test consists of two pronounced bottlenecks; each of it is formed as a workcenter with its own dedication matrix. After testing the method with practice oriented benchmarks, the benefits of the approach are shown on data derived directly from the semiconductor manufacturing process.
机译:对于数学以及基于仿真的方法,调度实际制造系统的工作通常非常艰巨。结合这两种方法是解决复杂调度问题的关键。本文介绍了一种特殊的方法,首先通过混合整数编程(MIP)解决静态资源分配问题。基于所得的简化专用矩阵,然后通过离散事件模拟(DES)生成可行的时间表。可能的应用可以在半导体制造过程的许多部分中找到,例如在晶圆测试中。所研究的晶圆测试包括两个明显的瓶颈。它的每一个都形成有自己的奉献矩阵的工作中心。用面向实践的基准测试该方法后,直接从半导体制造过程获得的数据显示了该方法的优势。

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