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Electroluminescence properties of porous silicon nanostructures with optimum current density of photo-electrochemical anodisation

机译:具有最佳电流密度的光电化学阳极氧化的多孔硅纳米结构的电致发光特性

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P-type silicon wafer (<100> orientation; boron doping; 0.75 ∼ 10 Ωcm−1) was used to prepare samples of porous silicon nanostructures (PSiNs). All samples have been prepared by using photo-electrochemical anodization. A fixed etching time of 30 minutes and volume ratio of electrolyte, hydrofluoric acid 48% (HF48%) and absolute ethanol (C2H5OH), 1:1 were used for various current densities, J. There were sample A (J=10 mA/cm2), sample B (J=20 mA/cm2), sample C (J=30 mA/cm2), sample D (J=40 mA/cm2) and sample E (J=50 mA/cm2). Photoluminescence (PL) and EL spectra were investigated. Maximum peak position of PL spectrum at about ∼675 nm, while the maximum EL spectrum at about ∼650 nm (which is similar to the PL spectrum).
机译:使用P型硅片(<100>取向;硼掺杂; 0.75〜10μcm -1 )制备多孔硅纳米结构(PSiNs)的样品。所有样品均采用光电化学阳极氧化法制备。固定蚀刻时间为30分钟,电解质,氢氟酸48%(HF48%)和无水乙醇(C 2 H 5 OH)的体积比为1:1用于各种电流密度J。样品A(J = 10 mA / cm 2 ),样品B(J = 20 mA / cm 2 ),样品C (J = 30 mA / cm 2 ),样品D(J = 40 mA / cm 2 )和样品E(J = 50 mA / cm 2 ) / sup>)。研究了光致发光(PL)和EL光谱。 PL光谱的最大峰位置在约675 nm处,而最大EL光谱在约650 nm处(与PL光谱相似)。

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