首页> 外文会议>2012 IEEE 14th Electronics Packaging Technology Conference >Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability
【24h】

Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability

机译:先进晶圆级封装技术的挑战:成本效益,集成度和可扩展性

获取原文
获取原文并翻译 | 示例

摘要

Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.
机译:当前,各种晶圆级封装(WLP)技术现在正在非常高的海拔上航行,特别是在移动和便携式应用中。这是包装业务的重要趋势:2012年,预计将有超过250亿个WLP单元安装在智能手机,平板电脑或便携式设备中。降低成本和小型化仍然是采用WLP技术的主要推动力。与传统的引线键合和倒装芯片封装相比,晶圆级封装需要更高的资本支出,因为它具有类似于fab的工具用于薄膜金属和介电聚合物的再分配过程。进一步降低成本是进入当前市场范围之外的市场的关键因素。随着更高的IO密度和功能集成,WLP尺寸也在不断增加,因此,板级可靠性对于进入更广阔的应用领域将是关键挑战。本文将讨论先进的晶圆级封装技术的技术挑战和市场需求,包括扇入,扇出(FO),凸点和TSV(硅直通孔)等。以及潜在的解决方案和行业方法这些挑战将被提出。将介绍一些有关材料和工艺中晶圆级封装的商机和降低成本方法的更深刻见解。最后,将讨论晶圆级封装技术的新趋势,包括大面板或大批量生产的可扩展性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号