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Center Gate Molding challenges and improvements for cavity down TBGA packages

机译:中心浇口成型挑战以及改进型腔TBGA封装的改进

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摘要

Center Gate Molding or also known as Pin Gate Molding is a molding method that is gaining a lot of interest in the market in recent times. This is due to its improvement in wire sweep performance for ultra fine pitch wire bonding and ability to capitalize desirable mold compound mechanical properties. The main reason for this is the mold flow of the compound is radial with the wire which will minimize flow stress on bonded wire rather than opposing the wire in the typical side gate molding. This paper discusses the key challenges and the improvements that have been implemented for the center gate molding for the cavity down TBGA (Tape Ball Grid Array) package in the High Volume Manufacturing (HVM). Substrate type which includes the different stack up of the polyimide tape was one of the major concerns for implementing molding on the cavity down TBGA package. The various substrate stack up of the polyimide tape were evaluated and Design of Experiments (DOE) were applied to determine the optimum molding process conditions in order to achieve a material set for overall process robustness.
机译:中心浇口成型(也称为销浇口成型)是一种成型方法,近年来在市场上引起了很多兴趣。这是由于它改善了用于超细间距引线键合的扫线性能,并能够利用所需的模塑料机械性能。造成这种情况的主要原因是,复合材料的模具流动是沿金属丝径向进行的,这将使键合金属丝上的流动应力最小化,而不是在典型的侧浇口成型中与金属丝相对。本文讨论了大批量制造(HVM)中用于腔体向下TBGA(卷带式球栅阵列)封装的中心浇口成型所面临的主要挑战和改进。包含不同堆叠聚酰亚胺胶带的基板类型是在空腔向下TBGA封装上实施成型的主要考虑之一。对聚酰亚胺胶带的各种基材堆叠进行了评估,并应用“实验设计”(DOE)来确定最佳成型工艺条件,以便获得用于整体工艺鲁棒性的材料。

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