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Micropulsed system for studying thermal properties of metallic nano-films at room conditions

机译:用于研究室温下金属纳米薄膜热性能的微脉冲系统

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An electronic system for applying electrical current pulses with fixed time between 10 and 500 μs on metallic films is described. The system is capable to measure changes on the electrical resistance (i.e, temperature) at room temperature and atmospheric pressure, when micropulses are applied on the nano-thickness metallic films deposited on thick substrates. The proposed electronic system is mainly formed by three sections: the micropulses generator section which works with a PIC 16F84A device, the signals processor section (AD712 and LT1210 amplifiers, and an AD734 multiplier/divider), and the data acquisition section integrated by a digital oscilloscope Tektronix model DPO 4050. By applying controlled micropulses on the metallic films and measuring the corresponding changes of the electrical resistance, which are converted at temperature, it is possible to determine the heat capacity of the metallic films at nano-dimensional scale. The proposed electronic system is used to characterize gold thin films deposited on polymeric substrates. Preliminary results determine a heat capacity value of 118 ± 7 nJ/°C for a 100 nm-gold film.
机译:描述了一种用于在金属膜上施加具有介于10和500μs之间的固定时间的电流脉冲的电子系统。当微脉冲施加到沉积在厚基板上的纳米厚度金属膜上时,该系统能够测量室温和大气压下电阻(即温度)的变化。拟议的电子系统主要由三个部分组成:与PIC 16F84A器件一起工作的微脉冲发生器部分,信号处理器部分(AD712和LT1210放大器以及AD734乘法器/除法器)以及由数字集成的数据采集部分。示波器是Tektronix DPO 4050型。通过在金属膜上施加受控的微脉冲并测量在温度下转换的电阻的相应变化,可以确定纳米级金属膜的热容量。所提出的电子系统用于表征沉积在聚合物基材上的金薄膜。初步结果确定了100 nm金膜的热容值为118±7 nJ /°C。

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