首页> 外文会议>2012 20th Iranian conference on electrical engineering >Heteroepitaxial growth of InSb directly on (001) GaAs without any buffer layer using growth rate ramping by MBE
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Heteroepitaxial growth of InSb directly on (001) GaAs without any buffer layer using growth rate ramping by MBE

机译:使用MBE的生长速率斜率直接在(001)GaAs上异质外延生长InSb,而无需任何缓冲层

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Heteroepitaxial InSb layers were grown on semi-insulating (001) GaAs substrates without any buffer layer showing good quality and acceptable electron mobilities at both 77K and 300K. The heteroepitaxial growth was started with the lowest possible rate by slowly ramping of Indium source temperature from its idle value up to the nominal one corresponding to a growth rate of approximately a micron per hour. This procedure speeds up the production and eliminates unwanted impurities without losing much mobility as a tradeoff. Also some empirical lines fitted to previously reported data indicating that creditable 77K (300K) mobilities of heteroepitaxial InSb/GaAs layers are within 30%–80% (50%–100%) of minimum homoepitaxial mobilities, and half of our measured mobilities are well within the regions.
机译:异质外延InSb层生长在没有任何缓冲层的半绝缘(001)GaAs衬底上,在77K和300K时均显示出良好的质量和可接受的电子迁移率。通过使铟源温度从其闲置值缓慢上升到对应于每小时约微米的生长速率的标称值开始,以最低可能的速率开始异质外延生长。该过程加快了生产速度,并消除了多余的杂质,同时又没有损失太多的灵活性。另外,一些经验线拟合到先前报告的数据表明,可信赖的异质外延InSb / GaAs层的77K(300K)迁移率在最小同质外迁移率的30%–80%(50%–100%)之内,并且我们测得的迁移率的一半很好在区域内。

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