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Predictor-corrector latency insertion method for fast transient analysis of ill-constructed circuits

机译:预测-校正延迟插入方法,用于不良结构电路的快速瞬态分析

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摘要

This paper describes a predictor-corrector latency insertion method (LIM) for a fast transient analysis of an ill-constructed circuit. First, the basic LIM algorithm and limitations of the method are described. Next, we propose the predictor-corrector LIM with a large value of fictitious latency for the ill-constructed topologies. Finally, numerical results show that our proposed method is applicable and efficient for the fast simulation of the ill-constructed circuit.
机译:本文介绍了一种预测器-校正器等待时间插入方法(LIM),用于对构造不良的电路进行快速瞬态分析。首先,描述了基本的LIM算法和该方法的局限性。接下来,我们提出了对于构造不良的拓扑具有较大虚拟延迟值的预测器-校正器LIM。最后,数值结果表明,本文提出的方法适用于不良结构电路的快速仿真。

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