首页> 外文会议>Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE >Self-compensation limited conductivity in semi-insulating indium-doped Cd0.9Zn0.1Te crystals
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Self-compensation limited conductivity in semi-insulating indium-doped Cd0.9Zn0.1Te crystals

机译:半绝缘铟掺杂Cd 0.9 Zn 0.1 Te晶体的自补偿极限电导率

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Indium-doped Cd0.9Zn0.1Te crystals with semi-intrinsic conductivity have been investigated. Temperature dependence of their electrical characteristics shows a number of unconventional peculiarities: the thermal activation energy of conductivity is “anomalously” low (0.60–0.62 eV); the resistivity at elevated temperatures is greater than its intrinsic value for Cd0.9Zn0.1Te; the inversion of the conduction from n- to p-type occurs at a temperature slightly above 300 K, etc. The observed features are explained in terms of statistics of electrons and holes in a semiconductor containing a compensation center, whose concentration is much higher than those of uncontrolled (background) impurities and defects. Comparison of the calculation results and experimental data leads to the conclusion that the donor level, which is far distant from the middle of the band gap (∼ 0.3 eV), dominates the conductivity of the material and its compensation is virtually complete (Nd/Na = 0.99996–0.99998) as predicted by Mandel''s calculations. This result is of primary importance for the Cd1−xZnxTe Schottky diode detectors, since the width of the space charge region (active area of detector) in these devices is determined by the concentration of uncompensated impurities rather than the resistivity of the material.
机译:研究了具有半本征电导率的掺铟Cd 0.9 Zn 0.1 Te晶体。其电气特性的温度依赖性显示出许多非常规的特性:电导率的热活化能“异常地”低(0.60–0.62 eV);高温下的电阻率大于Cd 0.9 Zn 0.1 Te的固有值;当温度略高于300 K时,会发生从n型到p型导电的反转等。观察到的特征是根据包含补偿中心的半导体中电子和空穴的统计数据来解释的,该半导体的浓度远高于那些不受控制的(背​​景)杂质和缺陷。计算结果和实验数据的比较得出这样的结论:离带隙中心(〜0.3 eV)很远的施主能级主导了材料的电导率,并且补偿实际上已经完成(N d / N a = 0.99996–0.99998),这是由曼德尔的计算所预测的。该结果对于Cd 1-x Zn x Te肖特基二极管检测器至关重要,因为这些器件中的空间电荷区域(检测器的有效区域)的宽度由未补偿杂质的浓度而不是材料的电阻率决定。

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