Crystallographic image processing for Scanning Probe Microscopy: Development of a dedicated computer program

摘要

The crystallographic processing of 2D periodic Scanning Probe Microscopy (SPM) images is compared to the common practice of Crystallographic Image Processing (CIP) in transmission electron microscopy (TEM). This provides motivation for the development of a dedicated computer program for CIP in SPM. The current state of our program is briefly described, and the point spread function (PSF) of an atomic force microscope (AFM) is extracted from experimental images through CIP. The use of a geometric Akaike information criterion (AIC) to supplement standard CIP procedures is discussed in some detail.