Tool for analysis and quantification of fabrication layouts in nanomagnet-based computing

摘要

The coupling among nano-magnets, placed at specific locations, but not necessarily in a regular grid, can be used to perform logic operations. We have developed an image-processing tool that will help one to automatically analyze and characterize atomic force microscopy (AFM) images and magnetic force microscopy (MFM) images of fabrication attempts to identify errors and magnetization. This is currently a highly manual and tedious process. We quantify fabrication errors and generate an enhanced MFM image. The fabrication errors are quantified into 3 categories: missed, extra and merged. The enhanced MFM image shows only magnetization of the sample without any surface characteristics.